Test generation from P systems using model checking
نویسندگان
چکیده
منابع مشابه
Test generation from P systems using model checking
This paper presents some testing approaches based on model checking and using different testing criteria. First, test sets are built from different Kripke structure representations. Second, various rule coverage criteria for transitional, non-deterministic, cell-like P systems, are considered in order to generate adequate test sets. Rule based coverage criteria (simple rule coverage, context de...
متن کاملModel Checking Based Test Generation from P Systems Using P-Lingua
This paper presents an approach for P system testing, that uses model-checking for automatic test generation and P-Lingua as specification language. This approach is based on a transformation of the transitional, nondeterministic, cell-like P system into a Kripke structure, which is further used for test generation, by adding convenient temporal logic specifications. This paper extends our prev...
متن کاملTest Generation using Model Checking
Testing in the software industry is, in general an ad hoc task. There are guidelines to follow but in most cases do not cover sufficient portions of the software product. Recent work has been done to automatically generate test cases such that designers are no longer responsible for designing the test cases but ensuring that the specification of the software is valid. These formal specification...
متن کاملAutomatic Test Generation from Statecharts Using Model Checking
This paper describes a method for automatic generation of tests from specifications written in Statecharts. These tests are to be applied to an implementation to validate the consistency of the implementation with respect to the specification. For test coverage, we adapt the notions of control-flow coverage and data-flow coverage used traditionally in software testing to Statecharts. In particu...
متن کاملFunctional Test Generation using SAT-based Bounded Model Checking
Functional validation is one of the major bottlenecks in processor design methodology due to combined effects of increasing complexity and decreasing time-to-market. Increasing complexity of designs leads to larger set of design errors. Shorter time-tomarket requires a faster validation scheme. Simulation using functional test vectors is the most widely used form of processor validation. While ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: The Journal of Logic and Algebraic Programming
سال: 2010
ISSN: 1567-8326
DOI: 10.1016/j.jlap.2010.03.007